Offering components that cover the complete high speed and RF signal chain, Analog Devices enables design engineers to develop platform electronic test and measurement systems that have best-in-class performance and low cost of test and ownership across an ever increasing frequency range from DC to >100GHz and beyond. As the preeminent supplier of data converters, RF and microwave ICs, Analog Devices provides more than 2,000 high performance products across the entire frequency spectrum.![]() ADI Signal Process Diagram A vector signal analyzer is an instrument that measures the magnitude and phase of the measured signal at a single frequency within the range of the instrument. Their primary use is to make in-channel measurements on known signals, such as code domain power, error vector magnitude, and spectral flatness. They are useful in measuring and demodulating digitally modulated signals like cellular and Wi-Fi. Analog Devices, Inc. strengths throughout the spectrum include: ADC drivers and ADCs, DDS, and clock generation chips; ADI's PLL/VCOs and RF Switches dominate in RF instrumentation. ![]() View Power Management Products Additional Resources Technical Documents Analog Devices RF and Microwave IC Selection Guide 2015: ![]() The Impact of Clock Generator Performance on Data Converters: ![]() Power Management for Integrated RF ICs: ![]() Application Notes AN-0982 The Residual Phase Noise Measurement: ![]() AN-0983 Introduction to Zero-Delay Clock Timing Techniques: ![]() AN-0988 The AD9552: A Programmable Crystal Oscillator for Network Clocking Applications : ![]() AN-1051 Reference Design for the AD9552 Oscillator Frequency Upconverter: ![]() AN-1066 Power Supply Considerations for AD9523, AD9524, and AD9523-1 Low Noise Clocks: ![]() AN-1067 The Power Spectral Density of Phase Noise and Jitter: Theory, Data Analysis, and Experimental Results : ![]() AN-1217 Clock Distribution Circuit with Pin-Programmable Output Frequency, Output Logic Levels, and Fanout: ![]() AN-501 Aperture Uncertainty and ADC System Performance: ![]() AN-756 Sampled Systems and the Effects of Clock Phase Noise and Jitter: ![]() |